Focal Series Reconstruction in Annular Dark-Field STEM
Lewys Jones and Peter D Nellist, Microscopy and Microanalysis 18 (Supplement 2), July 2012, p1214-1215.
This manuscript was accepted for publication in "Proceedings: Microscopy and Microanalysis (2012)" published by Cambridge University Press on behalf of the Microscopy Society of America.
The accompanying invited talk was presented in the "A17 - Detectors, Correctors, and Analysis Methods" session,
on Thursday 2nd August 2012. An electronic version of the slides can be seen here.
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